Application of Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in the Analysis of Coating Failures
For clear, magnified images and quick, targeted analyses of elemental composition, SEM-EDS is the method of choice. Introduction. A scanning electron microscope (SEM) can be used to examine samples at very high magnifications – up to 1 million times! The analysis of coating failures with an SEM typically only uses magnifications up to 10,000X, however, …